Abstract: We present a new, pulsed-gate stress test approach to determine electrical parameter stability of SiC MOSFETs over a lifetime. We demonstrate that the results of our test procedure reflect ...
Abstract: This paper investigates the test procedures specified in UL 1741 SA and the upcoming revision to IEEE P1547.1. A 550 kVA photovoltaic inverter was chosen for the tests. This research reveals ...
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